Faculty Profile

Janak H Patel

Coordinated Sciences Lab
Janak H Patel
Janak H Patel
Professor Emeritus of Electrical and Computer Engineering
250 Coordinated Science Lab MC 228
1308 W. Main St.
Urbana Illinois 61801
(217) 333-6201

Primary Research Area

  • Reliable and High Performance Computing

Education

  • PhD - Electrical Engineering, Stanford University 1976

Biography

Patel￿s research contributions include Pipeline Scheduling, Cache Coherence, Cache Simulation, Cache Data Prefetch, Multiprocessor memory modeling and analysis, Interconnection Networks, On-line Error Detection, Reliability analysis of memories with ECC and Scrubbing, Design for Testability, Built-In Self-Test, Fault Simulation and Automatic Test Generation. Patel is the inventor of the well known Illinois Cache Coherence Protocol and Illinois Scan Architecture. Patel has supervised over 85 M.S. and Ph.D. theses and published over 200 technical papers.

During his academic stay at Illinois, Patel has had a major role in two start-ups. First was as founding technical advisor to Nexgen Microsystems, which gave rise to AMD￿s present line of microprocessors. Second was as a co-founder of Sunrise Test Systems, which now is the basis for many test tools from Synopsys. In addition, Patel has provided technical consulting to a wide range of industries on architecture, reliability and testing.

He received a Bachelor of Science degree in Physics from Gujarat University, India and Bachelor of Technology in Electrical Engineering from the Indian Institute of Technology, Madras, India, and a Master of Science and Ph.D. in Electrical Engineering from Stanford University. He is a Fellow of ACM and IEEE, a recipient of the 1998 IEEE Piore Award and IEEE Test Technology Council Lifetime Achievement Award.

For more information

Research Interests

  • VLSI Testing and Testability, VLSI Design Automation

Research Areas

  • Reliable and High Performance Computing

Honors

  • IEEE Test Technology Council Lifetime Achievement Award, 2016
  • Fellow, ACM, 2001
  • IEEE Emanuel R. Piore Award, 1998
  • Best Paper Award, 1998 IEEE VLSI Test Symposium
  • Associate, Center for Advanced Study, 1992-93
  • Fellow, IEEE, 1989

Research Honors

  • Distinguished Lecture, Texas A&M Univ., College Station, TX, 2009
  • Distinguished Lecture, Georgia Tech, Atlanta, GA, 2009
  • Distinguished Lecture, North Western University, Evanston, IL, 2009
  • Keynote Speaker, IEEE International Test Conference, Austin, TX, 2006
  • Distinguished Lecture, Electrical and Computer Engineering, Purdue University, 2001
  • Nomination for Best Paper Award, ACM/IEEE Design Automation Conf. 1994
  • MCM Packaging Distinguished Lecture, Georgia Tech, Atlanta, GA, 1994
  • Inaugurated the Distinguished Lecture Series on Electronic Design Automation at IBM, Endicott, NY, 1993
  • Analog Devices Distinguished Lecture, Univ. of Michigan, Ann Arbor, 1992
  • Nomination for Best Paper Award, ACM/IEEE Design Automation Conf. 1987 (simulation and Test Category)
  • Keynote Speaker 1985 AT&T Technologies Conference on Electronic Testing, April 1985